EPASTS_a124_mcusscMbistEccTransientErr
Description
This alert is reported by MCUSafetyStartupChecks_TC3x (MCUSSC) component when the memory Built-In-SelfTest failed, MCU failure.
Condition
EPAS memory BIST transient error detected.
Clear Condition
EPAS HW failure. EPAS power cycle N times and if persists, the gear needs to be changed.
Potential Impact
EPAS reset. If reset more than 6 then EPAS fallback to bootloader.
Customer Facing Message 1
Not Available
Customer Facing Message 2
Not Available
Audiences
service-fix
Models
Model Y;Model Y 2025+